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 TERMINÉ 

Automated in-line Metrology for Nanoscale Production (aim4np)

Date du début: 1 mars 2013, Date de fin: 31 août 2016,

Knowing the mechanical properties of workpieces and machine-tools also at the nanometer scale is an absolute necessity for an efficient nanoscale production. Current technologies are lacking the flexibility and robustness needed for measuring such key parameters as topography, morphology, roughness, adhesion, or micro- and nano-hardness directly in a production environment. This hinders rapid deve ...
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 13

 TERMINÉ 
This project will produce a new tool, the Volumetric Scanning Microwave Microscope (VSMM), for non-destructive 3D nanoscale structural characterisation. Full development of this new tool will take place ready for commercial exploitation within the project duration. The consortium, comprising three SMEs, a Large Company, an RTD Performer and two Research Institutions, will develop and commercialise ...
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 8

 TERMINÉ 

Exchangeable and Customizable Scanning Probe Tips (NanoBits)

Date du début: 1 sept. 2010, Date de fin: 31 août 2013,

The atomic force microscope (AFM) has become a standard and wide spread instrument for characterizingnanoscale devices and can be found in most of today's research and development areas. The NanoBitsproject provides exchangeable and customizable scanning probe tips that can be attached to standard AFMcantilevers offering an unprecedented freedom in adapting the shape and size of the tips to the su ...
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