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European Library-based flow of Embedded Silicon and test Instruments (ELESIS)
Date du début: 1 juin 2012, Date de fin: 1 juin 2015,
This project aims to increase European Integrated Circuits (IC) quality and competitiveness by developing generic test instruments and interfaces which will drasticly improve the testability and reliability of ICs.Presently, production testing of ICs is done by large and expensive Automated Test Equipment (ATE). A disadvantage of this approach is that while the production cost of a transistor decr ...
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