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 TERMINÉ 
Chemistry is fundamental to nanotechnology, as chemistry can prepare specifically tailored molecules to serve, in a bottom-up approach, as the building blocks for the fabrication of functional and structured nano-materials. Nanotechnology is the technology of the 21st century with applications from electronics to biotechnology and medicine. The next decade will thus be characterized by an increasi ...
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 14

 TERMINÉ 
"With the use of more advanced, but difficult-to-cut materials, on ever-more sophisticated products, the need to further develop and utilise the particular capabilities of the energy beam (EB) processing techniques seem to become a key enabler for the European industry. Although they are of various nature, a set of key communalities can be identified among EB methods when considered as dwell-time ...
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 11

 TERMINÉ 
"Intrinsic (or residual) stresses, resulting from manufacturing or processing steps, mostly define the performance and limit the lifetime of nanostructured materials, thin films, coatings and MEMS devices.The established techniques for micron-scale measurement of residual stress still have strong limitations, e.g. in terms of spatial resolution, lack of depth sensing, their applicability on non-cr ...
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 16

 TERMINÉ 

Universal SEM as a multi-nano-analytical tool (UnivSEM)

Date du début: 1 avr. 2012, Date de fin: 31 mars 2015,

The current scientific interest and next generation of nanotechnology-based products is combining converging fields and dealing with a large complexity (e.g. organic electronics, nanomedicine). We can see growing needs to visualize, manipulate, modify and characterize nano-objects in a single tool.The aim of the UnivSEM project is to develop a novel multimodal tool combining- a vision capability b ...
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 10

 TERMINÉ 

Multi-functional Analytical Focussed ion beam tool for nanotechnology (FIBLYS)

Date du début: 1 sept. 2008, Date de fin: 31 août 2011,

The project FIBLYS aims at developing an innovative nanostructuring, nanomanipulation and nanoanalysis instrument: a hybrid scanning probe (SPM) and dual beam focussed ion beam (FIB) instrument (including scanning electron microscopy (SEM) capabilities). In addition to an instrument based on conventional dual beam FIB(SEM) technology, an SPM/FIB(SEM) microscope will use both techniques, integrat ...
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 9