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Functional semiconductor nanowire probes (FUNPROB)

Date du début: 1 juil. 2011, Date de fin: 30 juin 2015,

Scanning probe microscopy (SPM) is an established technique for the characterisation of materials and structures at the nanoscale and is increasingly bridging traditional disciplines including the biosciences. As such, it is of fundamental and practical interest across the sciences and industry. The geometry of the tip is the critical factor which determines the resolution of an SPM sensor. In an ...
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