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The aim of this project is to develop a diffraction based transmission X-ray microscope, d-TXM, for non-destructive structural characterization of polycrystalline materials such as metals, ceramics, semiconductors, dust, soil and rocks, and for R&D applications in e.g. the energy-, electronics- and environmental sectors. Uniquely, d-TXM will be able to visualise the grains inside 100 micrometer th ...