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 TERMINÉ 

Nanoscale Defect Detection, Cleaning and Repair for Large Area Substrates (NANOMEND)

Date du début: 1 janv. 2012, Date de fin: 31 déc. 2015,

NanoMend will pioneer efforts to develop better, more integrated process inspection, cleaning, repair and control systems for nano-scale thin films on large area foils, and will do so in two exemplar vertical supply chains for functionalized polymer-coated paper products and for low cost flexible photovoltaics (PV). The aim is to demonstrate beyond state-of-the-art in-line detection, cleaning an ...
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 TERMINÉ 

Minimizing Defects in Micro-Manufacturing Applications (MIDEMMA)

Date du début: 1 nov. 2011, Date de fin: 31 oct. 2014,

Micro-manufacturing requires 'Zero-Defect' oriented approaches, both in large scale and in short-run production. Current quality control approaches, coming from macro-manufactring, are mainly based on post-process geometric control, which produces a large time lag between the defect generation and its detection, usually leading to large amount of defect parts (large scale) or wasted high value pro ...
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