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Modelling of the reliability and degradation of next generation nanoelectronic devices (MORDRED)
Date du début: 1 avr. 2011, Date de fin: 31 mars 2015,
"In this project we will develop multiscale modelling technology supported by comprehensive experimental characterization techniques to study the degradation and reliability of next generation Complimentary-Metal-Oxide-Semiconductor (CMOS) devices. Building upon fundamental analysis of the structure and electronic properties of relevant materials and interfaces at the quantum mechanical level, we ...
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