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Integrated Cicuit Testing Software (TEST-IC)

Date du début: 1 juil. 2015, Date de fin: 1 janv. 2016,

The project is in the semiconductor testing software field.In the semiconductors testing process, nowadays most of the test programs are implemented manually combining vector sequences generated by automated tools (ATPG, automated test pattern generator). This implementation embeds the possibility of human errors, which can cause yield loss (“over-testing”), or quality (test escape, “under-testing ...
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