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 TERMINÉ 

Nanoscale Defect Detection, Cleaning and Repair for Large Area Substrates (NANOMEND)

Date du début: 1 janv. 2012, Date de fin: 31 déc. 2015,

NanoMend will pioneer efforts to develop better, more integrated process inspection, cleaning, repair and control systems for nano-scale thin films on large area foils, and will do so in two exemplar vertical supply chains for functionalized polymer-coated paper products and for low cost flexible photovoltaics (PV). The aim is to demonstrate beyond state-of-the-art in-line detection, cleaning an ...
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 15

 TERMINÉ 

In-Line Areal Surface Measurement for Micro and Nano Production (InLineNano)

Date du début: 1 mai 2015, Date de fin: 31 oct. 2015,

A new optical interferometry technology has been developed which delivers fast and high precision areal surface measurements for stepped and structured micro-nanoscale surfaces which cannot be measured by traditional techniques. The technology addresses the market need for high throughput, simple sample preparation and nanoscale accuracy combined with an affordable system cost. Furthermore, a uniq ...
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 1

 TERMINÉ 
While nanotechnology was originally limited to small areas of a few cm2, the quest for lower costs has been the latest years the drive for developing processes utilising larger substrate sizes at increasing throughputs. A typical example is the flat panel display industry where the push to larger gen size and faster processing has resulted in a significant cost reduction. The next challenge here i ...
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 18

 TERMINÉ 

Minimizing Defects in Micro-Manufacturing Applications (MIDEMMA)

Date du début: 1 nov. 2011, Date de fin: 31 oct. 2014,

Micro-manufacturing requires 'Zero-Defect' oriented approaches, both in large scale and in short-run production. Current quality control approaches, coming from macro-manufactring, are mainly based on post-process geometric control, which produces a large time lag between the defect generation and its detection, usually leading to large amount of defect parts (large scale) or wasted high value pro ...
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 18

 TERMINÉ 

SELF OPTIMISING MEASURING MACHINE TOOLS (SOMMACT)

Date du début: 1 sept. 2009, Date de fin: 31 août 2012,

SOMMACT develops and validates an innovative production hardware and control system founded on understanding, evaluating and controlling production system performances. This approach is based on detection (in-process traceable measurement embedded capabilities) and compensation (adaptive control and self-learning capabilities) of geometrical effects of varying external and internal quantities, suc ...
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